Brief introduction for the functions of LCR meter

An LCR bridge using a microprocessor is called an LCR digital bridge. Common users also call these: LCR tester, LCR bridge, LCR meter, etc. Can accurately measure a large number of electronic components: a wide range of measurement objects semiconductor components: capacitors, inductors, magnetic cores, resistors, transformers, chip components and network components, etc impedance parameter measurement. Other components: impedance assessment of printed circuit boards, relays, switches, cables, batteries, etc

Dielectric materials: assessment of the loss Angle of the dielectric constant of plastics, ceramics, and other materials.
Magnetic materials: assessment of the permeability and loss Angle of ferrite, amorphous and other magnetic materials. Semiconductor materials: dielectric constant, conductivity and C-V properties of semiconductor materials.

Liquid crystal materials: C-V properties of liquid crystal units, such as dielectric and elastic constants. Multi-parameter display at the same time can meet the requirements of comprehensive observation and evaluation of various distributed parameters of complex components, without repeatedly switching the measurement parameters. Inductance L and its DC resistance DCR can be measured at the same time, significantly improving the measurement efficiency of inductance. Using internal/external DC bias, combined with various scan test functions, the performance of magnetic materials, inductive devices can be accurately analyzed. Through the function of bias current stacking test, it can accurately measure the low-current stacking performance of high-frequency inductors, communication transformers and filters. The external current stacking device can make the bias current up to 40A to accurately analyze the high power and high current inductors. Accurate Ceramic Capacitance Measurement 1kHz and 1MHz are the main test frequencies for ceramic materials and capacitors.

Ceramic capacitors have the characteristics of low loss value, and their capacity and loss applied to the AC signal will have obvious changes. The instrument has a wide band test capability and provides excellent accuracy, six-bit resolution and automatic level control (ALC) function to meet the needs of reliable and accurate testing of ceramic materials and capacitors. Capacitance-voltage (C-VAC) characteristic measurement of liquid crystal cells is the main method to evaluate the properties of liquid crystal materials. Conventional instruments to measure the C-VAC characteristics of liquid crystal cells meet a problem that the maximum test voltage is not enough. The extended measurement option provides a programmable test signal level with a resolution of 1% and up to 20Vms, enabling it to measure the capacitance characteristics of liquid crystal materials under optimal conditions. Measurement of semiconductor materials and components When evaluating the manufacturing process of a MOS type semiconductor, parameters such as oxide layer capacitance and substrate impurity density are required, which can be derived from measurements of C-VDC characteristics. Through the provided DC source, combined with various scanning functions, it is convenient to complete the measurement of C-VDC characteristics. In order to test semiconductor devices on a wafer, extended cables and probes are required. The 1M / 2M / 4M extension cable option of the instrument minimizes cable extension errors. The distributed capacitance of various diodes, transistors and MOS tubes is also the test content of this instrument.